Flash NDT
Miniaturised flaw detector
Regular price
€1.999,00 EUR
Regular price
Sale price
€1.999,00 EUR
Unit price
per
Tax included.
Shipping calculated at checkout.
Couldn't load pickup availability
Portable USB flaw detector which is simple, convenient and that meet the increasingly updated needs of modern flaw detectors.
Features:
- Small size
- High level integration；
- Detection of material internal defects；
- Plug and play, compatible Xp,Win7,Win10；
- Easy and flexible calibration；
- Square wave pulse excitation, optimized electro-acoustic matching, more suitable for ultra-thick/ultra-thin workpiece detection；
- Support full wave, positive wave, negative wave and radio frequency signal；
- Support 80M-160M different sampling frequency；
- Support single crystal, double crystal, transmission mode detection；
- Support probe frequency range 1MHz-15MHz.
- Battery: 5 hours continuous operation
Operation:
- Support a variety of standard probes
- Products are widely used in pressure vessels, petrochemicals, aerospace, welding, railways, metallurgy, steel structures, electric power, boilers, nuclear industry, shipbuilding, aircraft manufacturing and automobile production
| Performance |
| Principle Ultrasonic (Pulse-Echo/E-E) |
|
Detection range 10mm – 2000mm |
|
Velocity 100-9999m/s ， Preset 26 common material sound velocities |
|
Probe delay 0-500us |
|
Display delay -199-200mm |
|
Dynamic range >36dB |
|
Sensitivity >64dB 200mm， 2mm flat bottomed hole |
|
Dimension(mm) 107× 35× 14mm |
|
Weight 0.05Kg |
|
Working Environment Temperature -10-60℃ Humidity 5%-60% |
| Drive system |
|
Square wave pulse 50-230V |
|
Pulse width 50– 1500ns |
|
Repeat frequency 100-5000Hz Continuous adjustable |
|
Matched damp 50Ω |
| Receive system |
|
Gain 0-80dB dynamic range |
|
Gain interval 0.1/0.2/0.5/1/2/6/12 |
|
Sampling frequency 80-160M |
|
Testing method Peak/edge |
| Testing method |
| Full wave/positive wave/negative wave/RF |
|
Bandwidth frequency 1.25/2.5/5/10/Wide frequency |
|
Mean value 1-100 |
| Storage |
| A scan raw data B scan imaging |
|
USB storage Save data via USB connected to U disk |
| Input-Output |
|
Probe connect C5 |
| Connect USB |
| Regional settings |
| Language Chinese/English |
|
Unit mm/inch |
|
Clock Real time display date/time |
| Gate |
|
Quantity 3 independent gates (1 interface gate） |
| Follow the gate Support gate 1 frame selection of boundary waves, gates 2 and 3 are always in the same position after boundary waves as follow-ups |
| Measured value display The maximum peak amplitude, position (SA), depth (DA), horizontal distance (PA, RA (remove the leading edge of the probe)) and the number of round trips in each gate. |
| Alarm Alarm logic is set in each gate (positive(wave is higher than |
| the gate)/negative(waveform is lower than gate)/close) |
| Quick operation |
| Full screen/lock screen/auto gain/freeze/envelope/device re-connection |
| Equivalent curve |
|
DAC/TCG 5 curves |
|
Standard GB 11345、 NB 47013 |
|
Standardize 10 non-sequential calibration points |
|
DGS Suitable for three reference types of large flat bottom/flat bottom hole/through hole, considering the reference attenuation, material attenuation and surface compensation factors, defect evaluation method: equivalent size/equivalent gain/percentage |
| Cloud |
|
Remote Assistance Wechat/Whatsapp |
|
Date Upload/download/analyze data |
|
Update Cloud upgrade/authorization |
| Configuration |
| Host Straight/Angle Probe line 1 2 2 Manual Tool box Coupling 1 1 1 |
Country of origin CHINA
Share
